Aaron Partridge, SiTime Corporation
Albina Borisevic, Oak Ridge National Lab
Alexei Gruverman, University of Nebraska
Alp Sehirlioglu, Case Western Reserve University
Anton Ievlev, ORNL
Anne Amy Klein, LPL
Barbara Malic, Jozef Stefan Institute
Benyamin Davaji, Cornell University
Brian Foley, Penn State University
Chengpeng Hu, Harbin Institute of Technology
Clive Randall, The Pennsylvania State University
David Ginger, University of Washington
David Hume, NIST
Dixiong Wang, University of Pennsylvania
Ernest Yen, Texas Instruments
Etienne Cantin, LNE-SYRTE
Florian Hausen, FZ Julich
Giuseppe Michetti, Northeastern University
Hana UrÅ¡iÄ, Jozef Stefan Institute
Hana Ursic, Jozef Stefan Institute
Hiroshi Funakubo, Tokyo Institute of Technology
Holger Röhm, KIT
Hong Wang, Xi’an Jiaotong University
Ingrid Canero-Infante, University of Lyon
Ingrid Infante, INL
Isabelle Dufour, Université de Bordeaux
Isaku Kanno, Kobe University
Jérôme Lodewyck, LNE-SYRTE
Jan Seidel, UNSW
Jérôme Lodewyck, LNE-SYRTE
Jiangyu Li, Chinese Academy of Science
Jonathan M. Puder, Adelphi
Joseph Guy, Queens University Belfast
Julian Walker, NTNU
Ke Wang, Tsinghua Univ.
Kevin Talley, National Renewable Energy Laboratory
Kohei Yamasue, Tohoku University
Laiming Jiang, University of Southern California
Lawrence Robins, NIST
Lin Zhou, Ames Lab
Luca Lorini, LNE-SYRTE
Manoj Kalubovilage, University of Colorado at Boulder
Marty Gregg, Queen's University of Belfast
Max Kessel, Fraunhofer
Michael Hoffmann, NaMLab
Murray Barrett, NUS Singapore
Neus Domingo, ICN2
Nils Nemitz, National Institute of Information and Communications Technology
Prasanna Balachandran, Univ. of Virginia
Rattakorn Kaewuam, Center for Quantum Technologies
Robert Tjoelker, JPL/CIT
Roozbeh Tabrizian, University of Florida
Sabine Neumayer, Oak Ridge National Laboratory
Sabine Neumyer, ORNL
Sakyo Hirose, Murata Manufacturing
Sanghun Jeon, KAIST
Shinnosuke Yasuoka, Tokyo Institute of Technology
Shuji Tanaka, Tohoku University
Simon Fichtner, Kiel University
Sohini Kar-Narayan, Cambridge University
Susan Trolier-McKinstry, Penn State University
Takanori Mimura, Tokyo Institute of Technology
Takuma Nakamura, National Institute of Standards and Technology
William Swann, National Institute of Standards and Technology
Xuefan Zhou, Central South University
Yao Zhu, Institute of Microelectronics (IME)
Yasuo Cho , Tohoku University
Yunfei Chang, Harbin Institute
Yunseok Kim, Sungkyunkwan Univ
Yutong Liu, Cornell University
Zhu Yao, IME, ASTAR