Aaron Partridge,  SiTime Corporation

Albina Borisevic,  Oak Ridge National Lab

Alexei Gruverman,  University of Nebraska

Alp Sehirlioglu,  Case Western Reserve University

Anton Ievlev,  ORNL

Anne Amy Klein, LPL

Barbara Malic, Jozef Stefan Institute 

Benyamin Davaji,  Cornell University

Brian Foley,  Penn State University

Chengpeng Hu,  Harbin Institute of Technology

Clive Randall,  The Pennsylvania State University

David Ginger,  University of Washington

David Hume,  NIST

Dixiong Wang,  University of Pennsylvania

Ernest Yen,  Texas Instruments

Etienne Cantin,  LNE-SYRTE

Florian Hausen,  FZ Julich

Giuseppe Michetti,  Northeastern University

Hana UrÅ¡ič,  Jozef Stefan Institute

Hana Ursic,  Jozef Stefan Institute

Hiroshi Funakubo,  Tokyo Institute of Technology

Holger Röhm,  KIT

Hong Wang,  Xi’an Jiaotong University

Ingrid Canero-Infante,  University of Lyon

Ingrid Infante,  INL

Isabelle Dufour,  Université de Bordeaux

Isaku Kanno,  Kobe University

Jérôme Lodewyck,  LNE-SYRTE

Jan Seidel,  UNSW

Jérôme Lodewyck, LNE-SYRTE

Jiangyu Li,  Chinese Academy of Science

Jonathan M. Puder,  Adelphi

Joseph Guy,  Queens University Belfast

Julian Walker,  NTNU

Ke Wang,  Tsinghua Univ.

Kevin Talley,  National Renewable Energy Laboratory

Kohei Yamasue,  Tohoku University

Laiming Jiang,  University of Southern California

Lawrence Robins,  NIST

Lin Zhou,  Ames Lab

Luca Lorini,  LNE-SYRTE

Manoj Kalubovilage,  University of Colorado at Boulder

Marty Gregg,  Queen's University of Belfast

Max Kessel,  Fraunhofer

Michael Hoffmann,  NaMLab

Murray Barrett, NUS Singapore 

Neus Domingo,  ICN2

Nils Nemitz,  National Institute of Information and Communications Technology

Prasanna Balachandran,  Univ. of Virginia

Rattakorn Kaewuam,  Center for Quantum Technologies

Robert Tjoelker,  JPL/CIT

Roozbeh Tabrizian,  University of Florida

Sabine Neumayer,  Oak Ridge National Laboratory

Sabine Neumyer,  ORNL

Sakyo Hirose,  Murata Manufacturing

Sanghun Jeon,  KAIST

Shinnosuke Yasuoka,  Tokyo Institute of Technology

Shuji Tanaka,  Tohoku University

Simon Fichtner,  Kiel University

Sohini Kar-Narayan,  Cambridge University

Susan Trolier-McKinstry,  Penn State University

Takanori Mimura,  Tokyo Institute of Technology

Takuma Nakamura,  National Institute of Standards and Technology

William Swann,  National Institute of Standards and Technology

Xuefan Zhou,  Central South University

Yao Zhu,  Institute of Microelectronics (IME)

Yasuo Cho ,  Tohoku University

Yunfei Chang,  Harbin Institute

Yunseok Kim,  Sungkyunkwan Univ

Yutong Liu,  Cornell University

Zhu Yao, IME, ASTAR